In order to achieve enhanced-Raman scattering without a metallic thin films, an attenuated total reflection (ATR) arrangement consisting of a prism, an amorphous SiO 2 gap layer, a copper phthalocyanine (CuPc) thin film and a fused quartz substrate was constructed. The ATR spectra exhibited sharp dips corresponding to the excitation of half-leaky guided modes, which are leaky in the prism, guided waves inside the SiO 2 gap layer and exponentially decay inside the substrate. Under excitation of the modes, Raman scattering from the CuPc film was found to be enhanced by a factor of ~10 2 over the normal Raman scattering. The present Raman enhancement can be well explained by strong electromagnetic fields induced in the CuPc film upon excitation of the half-leaky guided modes.