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The study of positron annihilation lifetime spectroscopy and X-ray diffraction on oxygen irradiated textured polycrystalline Bi 2 Sr 2 CaCu 2 O 8+δ and Bi 1.84 Pb 0.34 Sr 1.91 Ca 2.03 Cu 3.06 O 10+δ superconductors
Defects generated by 116 MeV oxygen ion irradiation on polycrystalline Bi 2 Sr 2 CaCu 2 O 8+δ (Bi-2212) and Bi 1.84 Pb 0.34 Sr 1.91 Ca 2.03 Cu 3.06 O 10+δ (Bi-2223) superconductors have been analysed by positron annihilation lifetime (PAL) and X-ray diffraction line profile (XRDLP) techniques. Agglomeration of defects and occupation at irradiation induced oxygen site by certain vacancies have been explained in the light of irradiation induced oxygen vacancies and their differences in these two systems. A significant increase in dislocation density is also observed in Bi-2212 at low dose in contrast to Bi-2223.