Electromigration and diffusion of hydrogen in palladium defected through quenching to liquid nitrogen temperature were investigated. It was found that the obtained experimental results cannot be described by means of a single flux of hydrogen which diffuses in a gradient of electric field. In order to effectively explain the obtained results, a theoretical model was elaborated. It assumed the existence of the following two fluxes of hydrogen in the quenched metal: • J i —of migration, according to the interstitial mechanism, and • J i–d —of migration, according to the interstitial-defective mechanism. Dependence of effective valences and diffusion coefficients for both mechanisms of transportation was determined in relation to the initial temperature of the quenching.