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Preparation, characterization and intercalation of ternary chalcogenides with layered composite crystal structures formed in the Bi-Ta-S and Bi-Ta-Se systems
Two kinds of chalcogenides with layered composite crystal structures have been formed in Bi-Ta-S and Bi-Ta-Se systems depending on the preparation conditions: (BiS) 1.08 TaS 2 and (BiS) 1.08 (TaS 2 ) 2 for the former system and (BiSe) 1.09 TaSe 2 and a new selenide (BiSe) 1.09 (TaSe 2 ) 2 for the latter. The new chalcogenide has been characterized by powder X-ray diffraction and electron diffraction. The atomic coordinates in the layer-stacking direction of the new chalcogenide and its hydrazine intercalation compound have been determined. The electrical resistivity measurement has suggested that all of these chalcogenides are low temperature superconductors.