The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A dielectric microwave resonators operating from 20 K to 70 K has been used to measure the temperature dependence of the penetration depth λ(T) for the high-T c superconducting YBa 2 Cu 3 O 7-δ and Tl 2 Ba 2 CaCu 2 O 7 thin films. A T 2 dependence occurs at low temperatures and an exponential dependence at high temperatures. An impurity scattered d-wave with admixture of s-wave due to thermal fluctuation is proposed for the pairing states of those high T c superconducting films.