The effect of uniaxial cold-drawing on the development of graphite structure in films of polyimide BPDA/PDA and PMDA/ODA was investigated with different draw ratios at the stage of polyamic acid by magnetoresistance and X-ray diffraction measurements after heat treatment at 2800°C for 30 minutes. With the increase in ratio of uniaxial drawing, the maximum transverse magnetoresistance decreased, showing the hindrance of graphitization. The increase of axial orientation mode of graphite layers and also the decrease of graphitization degree with the increase of draw ratio were proved by both magnetoresistance and X-ray diffraction measurements.