Thin films of lead lanthanum zirconate titanate (PLZT) were directly deposited on copper substrates by chemical solution deposition and crystallized at temperatures of ~650°C under low oxygen partial pressure (pO 2 ) to create film-on-foil capacitor sheets. The dielectric properties of the capacitors formed have much improved dielectric properties compared to those reported previously. The key to the enhanced properties is a reduction in the time that the film is exposed to lower pO 2 by employing a direct insertion strategy to crystallize the films together with the solution chemistry employed. Films exhibited well-saturated hysteresis loops with remanent polarization of ~20μC/cm 2 , dielectric constant of >1100, and dielectric loss of <0.07. Energy densities of ~32J/cm 3 were obtained at a field of ~1.9MV/cm on a ~1μm thick film with 250μm Pt electrodes.