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Optical properties of amorphous Se 80−x Te 20 Bi x thin films with different compositions (x=0, 2, 4, 6 and 8at.%) deposited by evaporation technique have been investigated by optical spectrophotometry measurements in the wavelength range of 400–2500nm. An optical characterization method for uniform films based on Swanepoel's ideas (envelope method) has been employed to extract...
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