A new method, ellipsometric polarization contour measurement (EPCM), is introduced to investigate for the optical anisotropy in organic materials. Comparing to the conventional ellipsometric measurement system, EPCM technique adopts rotational mode of an analyzer without polarizer. EPCM makes anisotropic properties of the material more directly characterized and gives additional information on the optic axis of the material. EPCM technique is applied to the organic photorefractive material to study the poling process. The phase difference due to electro-optic effect in our material is observed to be about 16 o at applied electric field of 50 V/μm by EPCM.