Scaled analog measurements in electromagnetic and light scattering are still a powerful tool when it comes to perform controlled experimental simulations, as well as to address issues that would not be easily or exclusively tackled through theoretical or numerical means, to assess approximate numerical methods and to test inverse scattering algorithms. Derived from previous achievements in this field, a new microwave analog to light scattering measurement device has been implemented, including the following distinctive features: use of long wavelengths ([1.5–15]cm; [2–20]GHz) to simplify the building and control of fully predefined complex shape particles, thanks to 3D positioning systems and rapid prototyping technologies; the realization of 3D measurements, where emitter and receiver are not necessarily in the same course, thus allowing exploration of a large number of scattering angles; the determination of both amplitude and phase for all elements of the amplitude scattering matrix for a non-spherical particle. A concise description of the components of the device, the methods used to fully define and control the characteristics of the target, the procedures to compare to calculations, and sample results up to date for direct and inverse problems are provided in this paper. These recent developments show the performances and further possibilities of this new device and its associated techniques to operationally tackle new challenges in scaled electromagnetic and light scattering measurements.