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Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi 2 Sr 2 CaCu 2 O 8+δ films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few lattice constants reflectivity is shown to be sensitive...
An orientational dependence of the resistivity and critical current density was observed in c-axis oriented Bi 2 Sr 2 CaCu 2 O 8+δ films grown on MgO substrates by pulsed-laser deposition. As derived from X-ray diffraction and scanning electron microscopy, the anisotropy is caused by the small tilt angle of the c-axis with respect to the substrate surface.
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