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In this work, we investigate the broad-band photoabsorption of an n-TiO2 thin film and its hole-blocking properties when a heterostructure is grown on a chemically textured p-Si substrate. We demonstrate that average specular reflectance of conformally grown TiO2 thin films on chemically prepared pyramidally textured Si substrates can be brought down to ∼0.2% (in the wavelength range of 300–1200nm),...
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