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Inverse spinel LiNiVO 4 thin films were prepared by rf-sputtering, fallowed by films annealed at 300, 450 and 600°C for 2h to induce the crystallization of the films. The films were characterized by X-ray diffraction, Rutherford backscattering spectroscopy, nuclear reaction analysis, Auger electron spectroscopy, atomic force microscopy and scanning electron microscope techniques. The Anodic...
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