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A dc method for measuring the critical exponent of the 1/f-noise spectral density in metallic film percolation system is developed. The power-law behavior of the 1/f-noise in a lower-resistivity rough Pt-film percolation system deposited on fracture surface (with self-affine structure) of α-Al 2 O 3 ceramics is systematically studied by using this new method. The result indicates that the hopping conductivity effect of this rough system is much stronger than that of the regular flat film percolation system.