A combined imaging and microdiffraction technique using high-energy synchrotron X-rays is described and used to reveal microstructure, damage and strain evolution around notches in SiC/SiC composites. This technique allows for monitoring the material for cracks while loading and mapping the strain distribution in fibers and matrix with a resolution of tens of microns. We show that at current resolutions this technique is capable of measuring the strain distribution near crack tips in ceramic matrix composites and observe load transfer effects.