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Electron density profiles across the 90-270 depth of Al/C multilayers on Ge substrates are determined from anomalous-dispersion X-ray specular reflectivity data collected at the Ge K edge and away from it. Refractive index parameters for Ge are determined by fits of reflectivity profiles observed from a Ge surface without the Al/C film at the two photon energies and used in the calculation of electron densities for single and triple Al/C bilayers deposited on Ge substrates. The layer structures are clearly resolved and the Al/C interfaces are found to be considerably broader than expected.