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The structural, optical and electrical properties of Cu1.8Se1-xSx (0.25 ≤ x ≤ 0.75) polycrystalline thin films deposited at room temperature by vacuum evaporation were studied as a function of composition. Energy dispersive X -ray analysis was used to determine the elemental composition of different films. Results indicate the incorporation of sulfur at the expense of selenium. X-ray diffraction analysis...
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