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Structural and optical properties of Ba 0.8 Sr 0.2 TiO 3 (BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO 2 /Ti/Pt, Si/SrRuO 3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.
Center of Advanced Material Research and Technology (CAMART) and Center of Excellence, Institute of Solid State Physics, 8 Kengaraga, LV-1063 Riga, Latvia
Center of Advanced Material Research and Technology (CAMART) and Center of Excellence, Institute of Solid State Physics, 8 Kengaraga, LV-1063 Riga, Latvia
Center of Advanced Material Research and Technology (CAMART) and Center of Excellence, Institute of Solid State Physics, 8 Kengaraga, LV-1063 Riga, Latvia