The effect of 835MeV Kr irradiation at 90K on a stable icosahedral quasicrystal (Al 6 5 Cu 2 5 Fe 5 V 5 ) is discussed here. A Kr-beam of this energy was chosen in order to keep the stopping power ~1300eV/Å in accordance with our previous work [Nucl. Instrum. Meth. B, 156 (1999) 201], while increasing the travelled path in which strong electronic excitations occur ( sample thickness). The ratio ρ(φ)/ρ(0) {resistivity at fluence φ/resistivity at zero fluence} of quasicrystal goes through oscillatory changes, up to ~1x10 1 2 ions/cm 2 where this ratio drops considerably. The ex situ XRD on the irradiated samples however shows the evidence of degradation of the structure after a critical fluence of 1x10 1 1 ions/cm 2 . From the ex situ XRD measurements, this degradation does not seem to increase with further fluence up to φ=1x10 1 3 ions/cm 2 .