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Zastosowano dopasowanie krzywych Lorentza do profilu linii dyfrakcyjnych dyfrakcji elektronowej otrzymanej z cienkiej warstwy CdCrTe uzyskanej metodą PLD. Krzywe te zostały dopasowane do krzywej eksperymentalnej za pomocą programu FITYK. Z szerokości linii wyznaczono rozmiar krystalitów który wynosi 60-143 ?. Przedstawiono dokładność metody w przypadku na materiałów nanostrukturalnych.
In this paper, the technology for fabricating NiFe/Cu/NiFe layered structures by magnetron sputtering is presented. Two series of samples were fabricated on a glass substrate with a layered structure, where the individual layers were 30 nm NiFe, 5 nm Cu, and finally NiFe with a thickness of 30 nm. The series differed in the type of technology mask used. A constant magnetic field was applied to the...