Journal of KONBiN > 2014 > No. 3 (31) > 5--12
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journal ISSN : | 1895-8281 |
journal e-ISSN : | 2083-4608 |
DOI | 10.2478/jok-2014-0018 |
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Bibliography
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[1] Barker V. E., O'Connor D. E.: Expert systems for configuration at Digital: XCON and beyond. Communications of the ACM, 32(3):298--318, March 1989.
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[2] Dapeng T., Li Peiyu L., Pan Xiaohong P., Embedded Fault Diagnosis Expert System Based on CLIPS and ANN, Computational Science – ICCS 2007 Lecture Notes in Computer Science Volume 4490, 2007, str. 957-960.
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[3] Gartner D., Sheppard J., W.: An Experiment in Encapsulation in System Diagnosis. Test Technology and Commercialization - Conference Record, AUTOTESTCON’96, ss. 468-472.