Results of ion erosion experiments performed on airborne microparticle environmental contamination are presented. A new method of microparticle depth profile analysis, based on application of sample rotation technique in SIMS analysis, is described. Sample rotation experiments, i.e. ion sputtering with application of variable azimuth incidence angle of the primary beam, are performed in order : to reduce shadowing effect in rough surface sputtering, and to obtain more uniform erosion of the atomic layers of the microparticles. Results of ANSYS simulation of spherical particle erosion are also presented.