Elektronika : konstrukcje, technologie, zastosowania > 2013 > Vol. 54, nr 1 > 46-53
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journal ISSN : | 0033-2089 |
journal e-ISSN : | 2449-9528 |
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[1] Bennett H. Е., Porteus J. О.: Relation between surface roughness and specular reflectance at normal incidence, J. of the Opt. Soc.of Am., Vol. 51, No. 2, 123-129, 1961.
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[3] Böhm J., Jech M., Vorlaufer G., Vellekoop M.: Comparison of parametric and profilometric surface analysis methods on machined surfaces, Proc. of IMechE, Vol. 223, Part J: J. of Eng. Tribology, 799-805, 2009.