Elektronika : konstrukcje, technologie, zastosowania > 2011 > Vol. 52, nr 12 > 47-49
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journal ISSN : | 0033-2089 |
journal e-ISSN : | 2449-9528 |
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[1] Milor L. S.: A Tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing. IEEE Trans, on Cir. and Syst.-ll. Analog and Dig. Sig. Proces., vol. 45, no. 10, pp. 1389-1407,1998.
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[2] Załęski D., Zielonko R., Bartosiński B.: Application of Complementary Signals in Built-in Self Testers for Mixed-Signal Embedded Electronic Systems. IEEE Trans, on Inst. and Measure., vol. 59, no. 2, pp. 345-352, 2010.
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[3] Tadeusiewicz M., Halgas S.: Multiple catastrophic fault diagnosis of linear circuits considering the component tolerances, in Proc. ECCTD, 2009, pp. 647-650.