Pomiary Automatyka Kontrola > 2008 > R. 54, nr 5 > 244-247
Source
Abstract
Identifiers
journal ISSN : | 0032-4110 |
Authors
Keywords
Additional information
Publisher
Fields of science
Bibliography
-
[1] Adamczak S., Janecki D.: Method of comparison of roundness profiles using cross-correlation function (in Polish). Metrology and measurement systems. vol. 5., z. 3. Warsaw 1998. pp. 141-151.
-
[2] Adamczak S., Makieła W.: Concept of statistical comparison of measuring devices accuracy (in Polish). Proceedings of the symposium „Metrology in quality management systems -4" Kielce - Ameliówka. 22-24 Sept. 2003.
-
[31 Rioul O., Vetterli M.: Waveletes and signal processing. IEEE Signal Processing Magazine, Oct. 1991, s. 14-38.