Optica Applicata > 2008 > Vol. 38, nr 4 > 635-641
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journal ISSN : | 0078-5466 |
journal e-ISSN : | 1899-7015 |
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Bibliography
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[1] BROWN G.W., HAWLEY M.E., THEIS C.D., YEH J., SCHLOM D.G., Atomic force microscopy examination of the evolution of the surface morphology of Bi4Ti3O12 grown by molecular beam epitaxy, Thin Solid Films 357(1), 1999, pp. 13–17.
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[2] JO W., CHO H., NOH T.W., KIM B.I., KIM D., KHIM Z.G., KWUN S., Structural and electro-optic properties of pulsed laser deposited Bi4Ti3O12 thin films on MgO, Applied Physics Letters, 63(16), 1993, pp. 2198–2200.
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[3] HWANG K., PARK Y., Annealing effect on in-plane alignment and surface morphology of epitaxial Bi4Ti3O12 thin films prepared by the chemical solution deposition, Journal of Material Research, 16(9), 2001, pp. 2519–25.