Przegląd Elektrotechniczny > 2010 > R. 86, nr 11a > 251-255
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journal ISSN : | 0033-2097 |
journal e-ISSN : | 2449-9544 |
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Bibliography
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[1] Maurice Clearc, “Particle Swarm Optimization,” ISTE, 2005
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[2] Kyzioł P., Grzechca D., Golonek T., Rutkowski J., The Use of Variable Load for RF Circuit Testing, ICSES 2008, pp. 557-560
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[3] Kabisatpathy, P., Barua, A., Sinha, S., “Fault Diagnosis of Analogue Integrated Circuits”, Springer, 2005