Biuletyn Wojskowej Akademii Technicznej > 2022 > Vol. 71, nr 2 > 49--83
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journal ISSN : | 1234-5865 |
DOI | 10.5604/01.3001.0016.2808 |
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Bibliography
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[2] Hudec R., Maršíková V., Pína L., Inneman A., Skulinová M., New trends in space x-ray optics, Proc. SPIE 10565, International Conference on Space Optics - ICSO 2010, 105652U (20 november 2017), https://doi.org/10.1117/12.2309110.
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[3] Zhou W., Apkarian R., Wang Z. L., Joy D., Fundamentals of Scanning Electron Microscopy (SEM), [in:] Zhou W., Wang Z. L. (eds), Scanning Microscopy for nanotechnology, Springer, New York, NY, 2006, https://doi.org/10.1007/978-0-387-39620-0_1.