Elektronika : konstrukcje, technologie, zastosowania > 2021 > Vol. 62, nr 4 > 21--25
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journal ISSN : | 0033-2089 |
journal e-ISSN : | 2449-9528 |
DOI | 10.15199/13.2021.4.5 |
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Bibliography
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[1] S. Timoshenko, G. McCullough (1949) “Elements of Strength of Materials”, NY.
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[2] K. Pitney (1973) “Ney Contact Manual” Bloomfield.
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[3] J. Kister, K. Dabrowiecki, (1997) “Analytical model of probe card performance at elevated temperature” IEEE SWTest, San Diego.