Archives of Electrical Engineering > 2024 > Vol. 73, nr 1 > 183--200
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journal ISSN : | 1427-4221 |
journal e-ISSN : | 2300-2506 |
DOI | 10.24425/aee.2024.148864 |
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Bibliography
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[2] Lu M., Forward and inverse analysis for non-destructive testing based on electromagnetic computation methods, PhD Thesis, The University of Manchester (United Kingdom) (2018).
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[3] Campbell S.D., Sell D., Jenkins R.P., Whiting E.B., Fan J.A., Werner D.H., Review of numerical optimization techniques for meta-device design, Optical Materials Express, vol. 9, no. 4, pp. 1842–1863 (2019), DOI: 10.1364/OME.9.001842.