Search results for: H. Kim
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Transactions on Dielectrics and Electrical Insulation > 2017 > 24 > 5 > 2755 - 2764
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-2 > 2278 - 2282
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-1 > 539 - 542
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
IEEE Transactions on Magnetics > 2015 > 51 > 11 > 1 - 4
IEEE Electron Device Letters > 2015 > 36 > 8 > 832 - 834
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1239 - 1243
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Micro > 2014 > 34 > 6 > 74 - 85