Wyniki wyszukiwania dla: S. Choi
International Journal of Control, Automation and Systems > 2013 > 11 > 4 > 815-825
IEEE Design & Test of Computers > 2011 > 28 > 2 > 30 - 39
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
International Journal of Control, Automation and Systems > 2013 > 11 > 4 > 815-825
IEEE Design & Test of Computers > 2011 > 28 > 2 > 30 - 39
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4