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We report the room-temperature dielectric function ε of AlP from 0.74 to 6.54eV obtained by in situ spectroscopic ellipsometry. Measurements were done on a 1.2μm thick film grown on (001) GaAs by molecular beam epitaxy, with ε extracted using a multilayer parametric model. Critical point energies of features in the ε spectra were obtained from numerically calculated second-energy-derivatives, and...
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