Search results for: F. Zhang
2013 IEEE International Electron Devices Meeting > 2.3.1 - 2.3.4
IEEE Electron Device Letters > 2012 > 33 > 4 > 480 - 482
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
Acta Materialia > 2011 > 59 > 16 > 6246-6256