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We have studied cadmium stearate Langmuir-Blodgett (LB) films by spectroscopic ellipsometry (SE) and we have compared the results with those obtained by using X-ray reflectivity and atomic force microscopy.The measurements on cadmium stearate LB films deposited on silicon wafers capped by a native oxide layer provide sound results for films formed by 1-25 molecular layers. The experimental data are...
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