Search results for: H. Kim
2013 IEEE International Electron Devices Meeting > 2.1.1 - 2.1.4
2013 IEEE International Electron Devices Meeting > 16.3.1 - 16.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.3.1 - 4A.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.4.1 - MY.4.6
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
2012 International Electron Devices Meeting > 32.2.1 - 32.2.4
2012 International Electron Devices Meeting > 32.3.1 - 32.3.4
2012 International Electron Devices Meeting > 23.1.1 - 23.1.4
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Spectrum > 2011 > 48 > 5 > 28 - 33
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
2010 International Electron Devices Meeting > 3.1.1 - 3.1.4