The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
SPA/SEMA (Simple Power/Electro-magnetic Analysis) attacks performed on public-key cryptographic modules implemented on FPGA platforms are well known from the theoretical point of view. However, the practical aspect is not often developed in the literature. But researchers know that these attacks do not always work, like in the case of an RSA accelerator. Indeed, SEMA on RSA needs to make a difference...
Deposition rate, thickness unriformity and step coverage of SiO2 films deposited on Si substrates by pyrolysis of TEOS have been studied as a function of process parameters: temperature, pressure, and gas flow. Oxide films with iformrities of ??1% on 100-mm. wafers and step coverage of 76% on 1 ??m wide and deep trenches have been obtained. The electrical characterization of TEOS-SiO2 films deposited...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.