Search results for: M. Chen
Microelectronics Reliability > 2015 > 55 > 9-10 > 1872-1876
2014 IEEE International Reliability Physics Symposium > CD.4.1 - CD.4.9
IET Information Security > 2010 > 4 > 4 > 361 - 373
Microelectronics Journal > 2006 > 37 > 11 > 1372-1378
Journal of Electronic Materials > 2004 > 33 > 8 > 900-907