Search results for: J. Huang
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4
2008 IEEE Sensors > 1328 - 1331