Search results for: Gerard Ghibaudo
Microelectronics Reliability > 2017 > 79 > C > 281-287
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
Microelectronics Reliability > 2015 > 55 > 9-10 > 1417-1421
IEEE Electron Device Letters > 2013 > 34 > 10 > 1298 - 1300