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The idea of the test chip experiments started in ITC 1991 (McCluskey and Tseng, 2000). We wanted to get actual tester data that would answer some questions about manufacturing test of digital ICs. The objective was to find out the relative effectiveness of different test techniques, such as stuck fault tests, delay tests, IDDq, etc. The test chips are Murphy, ELF35, ELF18, and ELF13.
In this article, we evaluate the impact of idle-cycle insertion on yield by quantifying the number of test escapes. We empirically quantify false failures resulting from IR drop by inserting idle cycles at appropriate points during the scan test application protocol. Launch delay (LD) test delays the launch clock by inserting a certain amount of time (called idle cycles or idle time) after the last...
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