Search results for: C.D. Young
Microelectronic Engineering > 2007 > 84 > 9-10 > 1874-1877
IEEE Electron Device Letters > 2007 > 28 > 8 > 734 - 736
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Electron Device Letters > 2006 > 27 > 12 > 984 - 987
Microelectronic Engineering > 2005 > 80 > Complete > 218-221