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A systematic method is proposed to address modeling challenges in accurate chip level leakage prediction, namely a precise total leakage width count method, a simple model to quantify leakage uplift caused by systematic across-chip variation, and a consistent model to capture 3-sigma leakage and leakage spread at fixed performance.
Over the past three technology generations we have made systematic observations on device-design strategies leading to optimal circuit-limited yield. These strategies now impose additional considerations that need to be directly coupled into the technology-development paradigm. At the core of the present discussion is the balance between traditional FET (Field Effect Transistor) and small-circuit...
An integrated configuration is proposed to convert tunable slow light from signal to another frequency in a wide bandwidth by using a 70 m-long highly nonlinear photonic crystal fiber (HN-PCF). A 10 GHz RZ signal is delayed by a 10 Gbit/s 231-1 pseudo random bit sequence (PRBS) stimulated Brillouin scattering (SBS) pump, and the slow light is converted to another frequency in a broadband by four-wave...
New effective drive current IEFF+ methodologies are demonstrated in this paper to address predictability of circuit performance across wide Vt range and accuracy of effective resistance REFF prediction-to-hardware correlation. Two separate IEFF definitions are adopted for delay performance prediction (IEFF = [IH + IL]/2), and ring AC/DC prediction-tohardware correlation analysis (IEFF+ = [1.15IH...
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