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This paper deals with the susceptibility to radio frequency interference of smart power integrated circuits. A method to perform simulations aimed at evaluating the performance of subcircuits included in a more complex IC in the presence of EMI is presented. Referring to this, the behaviour of a current sensor included into a high-side power switch during DPI test is investigated. The results of simulation...
A digital input designed to be immune to high EMI level without showing false commutations and wrong logic level failures is presented in this paper. The operation of the proposed circuit in the presence of continuous wave EMI has been tested by transistor level, time domain computer simulations and an immunity level in the 10 MHz-1 GHz band, which is more than 20dB higher than that of standard digital...
The closed-loop bulk current injection (BCI) method employed to measure the immunity to electromagnetic interference of an electronic equipment in compliance with the ISO 11452-4 standard is critically assessed on the basis of an experimental characterization of its test setup. It is highlighted that, above 100 MHz, the injected bulk current estimated by the calibration procedure described in the...
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