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In the companion paper [1], an algorithm to calculate the worst case-induced voltages at the terminations of a uniform microstrip line illuminated by an electromagnetic plane wave has been presented. Here, this algorithm is used to calculate the worst case voltage at the ends of a microstrip line terminated by real analog and digital transceivers. Specifically, the influence of the microstrip design...
This paper deals with the experimental characterization of integrated circuit electromagnetic emissions. The influence of the IEC standardized board layout on the conducted emission of an integrated circuit has been analyzed by full-wave and circuital simulations. Guidelines for the design of such a test board which help to improve measurement repeatability are also provided.
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