Search results for: I. Vai
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 4 > 757 - 766
Physics Letters B > 2017 > 765 > C > 193-220
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 4 > 757 - 766
Physics Letters B > 2017 > 765 > C > 193-220