Search results for: H. Jung
Microelectronics Reliability > 2016 > 64 > C > 541-546
IEEE Photonics Technology Letters > 2009 > 21 > 11 > 700 - 702
Microelectronics Reliability > 2016 > 64 > C > 541-546
IEEE Photonics Technology Letters > 2009 > 21 > 11 > 700 - 702