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The closed-loop bulk current injection (BCI) method employed to measure the immunity to electromagnetic interference of an electronic equipment in compliance with the ISO 11452-4 standard is critically assessed on the basis of an experimental characterization of its test setup. It is highlighted that, above 100 MHz, the injected bulk current estimated by the calibration procedure described in the...
This paper deals with the susceptibility to electromagnetic interference of CMOS integrated current sensors for power transistor current monitoring. Conventional integrated solution are first considered, hence a new integrated current sensor based on the Hall effect in MOS transistors (MagFET) is proposed. The susceptibility to radio frequency interference of a conventional (wired) current sensor...
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