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Modulated thermoreflectance microscopy is applied to the simultaneous determination of the thermal boundary resistances and diffusivities of thin YBaCuO superconducting films deposited on ZrO 2 , LaAlO 3 , or SrTiO 3 substrates. A rigorous thermal diffusion model is used to fit the observed dependences of the thermoreflectance signal amplitude and phase on the separation between...
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