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As the technology scales, process variations and model inaccuracies impact design yield. In this paper, we demonstrate a statistical analysis methodology targeting both memory and custom logic design applications. For advanced technologies, we extend the methodology to enable key features such as FEOL and BEOL parasitic extraction and TCAD for manufacturability. This increases the statistical confidence...
Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks.
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